The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500(tm) (2006)
The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500(tm) (2006)
By Francisco Da Silva, Teresa McLaurin, Tom Waayers
Hardcover
(1)
AED
805
91
AED 1,071.00
24% OFF
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By Manoj Sachdev, José Pineda de Gyvez
Hardcover
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1,023
34
AED 1,590.00
35% OFF
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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault (2010)
Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault (2010)
Paperback
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523
45
AED 1,044.00
49% OFF
Turbo
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CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
By Andrei Pavlov, Manoj Sachdev
Paperback
AED
603
67
AED 1,285.00
53% OFF
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Oscillation-Based Test in Mixed-Signal Circuits
Oscillation-Based Test in Mixed-Signal Circuits
By Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, Jose Luis Huertas Díaz
Paperback
AED
798
33
AED 1,159.00
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New Methods of Concurrent Checking
New Methods of Concurrent Checking
By Michael Gössel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld
Paperback
AED
543
56
AED 1,182.00
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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault (2010)
Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault (2010)
Hardcover
AED
534
49
AED 879.00
39% OFF
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Timing Performance of Nanometer Digital Circuits Under Process Variations (2018)
Timing Performance of Nanometer Digital Circuits Under Process Variations (2018)
By Victor Champac, Jose Garcia Gervacio
Hardcover
AED
614
60
AED 1,252.00
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Timing Performance of Nanometer Digital Circuits Under Process Variations (Softcover Reprint of the Original 1st 2018)
Timing Performance of Nanometer Digital Circuits Under Process Variations (Softcover Reprint of the Original 1st 2018)
By Victor Champac, Jose Garcia Gervacio
Paperback
AED
612
40
AED 887.00
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500(tm) (2006)
The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500(tm) (2006)
By Francisco Da Silva, Teresa McLaurin, Tom Waayers
Paperback
(1)
AED
569
21
AED 942.00
39% OFF
Turbo
Free Delivery26 - 27 Nov
Advances in Electronic Testing: Challenges and Methodologies (2006)
Advances in Electronic Testing: Challenges and Methodologies (2006)
Paperback
AED
797
74
AED 1,407.00
43% OFF
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (2002)
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (2002)
By M Bushnell, Vishwani Agrawal
Paperback
AED
384
79
AED 535.00
28% OFF
Turbo
Free Delivery25 - 26 Nov
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