This book discusses the digital design of integrated circuits under
process variations, with a focus on design-time solutions. The authors
describe a step-by-step methodology, going from logic gates to logic
paths to the circuit level. Topics are presented in comprehensively,
without overwhelming use of analytical formulations. Emphasis is placed
on providing digital designers with understanding of the sources of
process variations, their impact on circuit performance and tools for
improving their designs to comply with product specifications. Various
circuit-level "design hints" are highlighted, so that readers can use
then to improve their designs. A special treatment is devoted to unique
design issues and the impact of process variations on the performance of
FinFET based circuits. This book enables readers to make optimal
decisions at design time, toward more efficient circuits, with better
yield and higher reliability.