Andrei Pavlov
(Author)CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and TestPaperback, 28 October 2010
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Part of Series
Frontiers in Electronic Testing
Print Length
194 pages
Language
English
Publisher
Springer
Date Published
28 Oct 2010
ISBN-10
904817855X
ISBN-13
9789048178551
Product Details
Authors:
Book Format:
Paperback
Country of Origin:
NL
Date Published:
28 October 2010
Dimensions:
23.39 x
15.6 x
1.14 cm
ISBN-10:
904817855X
ISBN-13:
9789048178551
Language:
English
Location:
Dordrecht
Pages:
194
Publisher:
Weight:
303.91 gm