Electromigration Modeling at Circuit Layout Level (2013)
Electromigration Modeling at Circuit Layout Level (2013)
By Cher Ming Tan, Feifei He
Paperback
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291
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (2011)
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (2011)
By Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Paperback
AED
519
80
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
By Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Hardcover
AED
523
42
AED 781.00
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