Cher Ming Tan
(Author)Electromigration Modeling at Circuit Layout Level (2013)Paperback - 2013, 4 May 2013
Qty
1
Turbo
Ships in 2 - 3 days
In Stock
Free Delivery
Cash on Delivery
15 Days
Free Returns
Secure Checkout
Part of Series
Springerbriefs in Applied Sciences and Technology
Part of Series
Springerbriefs in Applied Sciences and Technology / Springer
Part of Series
Springerbriefs in Reliability
Print Length
103 pages
Language
English
Publisher
Springer
Date Published
4 May 2013
ISBN-10
9814451207
ISBN-13
9789814451208
Product Details
Authors:
Book Edition:
2013
Book Format:
Paperback
Country of Origin:
NL
Date Published:
4 May 2013
Dimensions:
23.39 x
15.6 x
0.61 cm
Genre:
Science/Technology Aspects
ISBN-10:
9814451207
ISBN-13:
9789814451208
Language:
English
Location:
Singapore
Pages:
103
Publisher:
Series:
Weight:
172.36 gm