Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By Manoj Sachdev, José Pineda de Gyvez
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Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration (Softcover Reprint of the Original 1st 2011)
Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration (Softcover Reprint of the Original 1st 2011)
By Amir Zjajo, José Pineda de Gyvez
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Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration
By Amir Zjajo, José Pineda de Gyvez
Hardcover
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Integrated Circuit Defect-Sensitivity: Theory and Computational Models (Softcover Reprint of the Original 1st 1993)
Integrated Circuit Defect-Sensitivity: Theory and Computational Models (Softcover Reprint of the Original 1st 1993)
By José Pineda de Gyvez
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By Manoj Sachdev, José Pineda de Gyvez
Paperback
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749
60
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