Stanley L Hurst

(Author)

VLSI Testing: Digital and Mixed Analogue/Digital TechniquesHardcover, 30 June 1998

VLSI Testing: Digital and Mixed Analogue/Digital Techniques
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Part of Series
Materials, Circuits and Devices
Part of Series
Iet Circuits, Devices and Systems
Print Length
552 pages
Language
English
Publisher
Institution of Engineering & Technology
Date Published
30 Jun 1998
ISBN-10
0852969015
ISBN-13
9780852969014

Description

The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategies should be part of every circuit and system designer's education. This book is a comprehensive introduction and reference for all aspects of IC testing. It includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing. In addition to detailed coverage of digital network testing, VLSI testing also considers in depth the growing area of testing analogue and mixed analogue/digital ICs, used particularly in signal processing.

Product Details

Author:
Stanley L Hurst
Book Format:
Hardcover
Country of Origin:
GB
Date Published:
30 June 1998
Dimensions:
23.39 x 15.6 x 3.02 cm
ISBN-10:
0852969015
ISBN-13:
9780852969014
Language:
English
Location:
Stevenage
Pages:
552
Weight:
948.01 gm

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