Amir Zjajo

(Author)

Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms (2014)Hardcover - 2014, 28 November 2013

Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms (2014)
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Part of Series
Springer Advanced Microelectronics
Part of Series
Springer Series in Advanced Microelectronics
Print Length
192 pages
Language
English
Publisher
Springer
Date Published
28 Nov 2013
ISBN-10
9400777809
ISBN-13
9789400777804

Description

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits.

In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology.

Product Details

Author:
Amir Zjajo
Book Edition:
2014
Book Format:
Hardcover
Country of Origin:
NL
Date Published:
28 November 2013
Dimensions:
23.39 x 15.6 x 1.27 cm
Genre:
Science/Technology Aspects
ISBN-10:
9400777809
ISBN-13:
9789400777804
Language:
English
Location:
Dordrecht
Pages:
192
Publisher:
Weight:
476.27 gm

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