Control charts are widely used in industry to monitor processes that are
far from Zero-Defect (ZD), and their use in a near Zero-Defect
manufacturing environment poses many problems. This book presents
techniques of using control charts for high-quality processes, and some
recent findings and applications of statistical control chart techniques
for ZD processes are presented.
A powerful technique based on counting of the cumulative conforming
(CCC) items between two nonconforming ones is discussed in detail.
Extensions of the CCC chart are described, as well as applications of
cumulative sum and exponentially weighted moving average techniques to
CCC-related data, multivariate methods, economic design of control chart
procedures, and modeling and analysis of trended but regularly adjusted
processes.
Many examples, charts, and procedures, are presented throughout the
book, and references are provided for those interested in exploring the
details. A number of questions and issues are posed for further
investigations. Researchers and students may find many ideas in this
book useful in their academic work, as a foundation is laid for the
exploration of many further theoretical and practical issues.