Smart and Flexible Digital-to-Analog Converters proposes new concepts
and implementations for flexibility and self-correction of
current-steering digital-to-analog converters (DACs) which allow the
attainment of a wide range of functional and performance specifications,
with a much reduced dependence on the fabrication process.
DAC linearity is analysed with respect to the accuracy of the DAC unit
elements. A classification is proposed of the many different
current-steering DAC correction methods. The classification reveals
methods that do not yet exist in the open literature. Further, this book
systematically analyses self-calibration correction methods for the
various DAC mismatch errors. For instance, efficient calibration of DAC
binary currents is identified as an important missing method.
This book goes on to propose a new methodology for correcting mismatch
errors of both nominally identical unary as well as scaled binary DAC
currents. A new concept for DAC flexibility is presented. The associated
architecture is based on a modular design approach that uses parallel
sub-DAC units to realize flexible design, functionality and performance.
Two main concepts, self-calibration and flexibility, are demonstrated in
practice using three DAC testchips in 250nm, 180nm and 40nm standard
CMOS. Smart and Flexible Digital-to-Analog Converters will be useful
to both advanced professionals and newcomers in the field. Advanced
professionals will find new methods that are fully elaborated from
analysis at conceptual level to measurement results at test-chip level.
New comers in the field will find structured knowledge of fully
referenced state-of-the art methods with many fully explained novelties.
DAC linearity is analysed with respect to the accuracy of the DAC unit
elements. A classification is proposed of the many different
current-steering DAC correction methods. The classification reveals
methods that do not yet exist in the open literature. Further, this book
systematically analyses self-calibration correction methods for the
various DAC mismatch errors. For instance, efficient calibration of DAC
binary currents is identified as an important missing method.
This book goes on to propose a new methodology for correcting mismatch
errors of both nominally identical unary as well as scaled binary DAC
currents. A new concept for DAC flexibility is presented. The associated
architecture is based on a modular design approach that uses parallel
sub-DAC units to realize flexible design, functionality and performance.
Two main concepts, self-calibration and flexibility, are demonstrated in
practice using three DAC testchips in 250nm, 180nm and 40nm standard
CMOS. Smart and Flexible Digital-to-Analog Converters will be useful
to both advanced professionals and newcomers in the field. Advanced
professionals will find new methods that are fully elaborated from
analysis at conceptual level to measurement results at test-chip level.
New comers in the field will find structured knowledge of fully
referenced state-of-the art methods with many fully explained novelties.
This book goes on to propose a new methodology for correcting mismatch
errors of both nominally identical unary as well as scaled binary DAC
currents. A new concept for DAC flexibility is presented. The associated
architecture is based on a modular design approach that uses parallel
sub-DAC units to realize flexible design, functionality and performance.
Two main concepts, self-calibration and flexibility, are demonstrated in
practice using three DAC testchips in 250nm, 180nm and 40nm standard
CMOS. Smart and Flexible Digital-to-Analog Converters will be useful
to both advanced professionals and newcomers in the field. Advanced
professionals will find new methods that are fully elaborated from
analysis at conceptual level to measurement results at test-chip level.
New comers in the field will find structured knowledge of fully
referenced state-of-the art methods with many fully explained novelties.
Two main concepts, self-calibration and flexibility, are demonstrated in
practice using three DAC testchips in 250nm, 180nm and 40nm standard
CMOS. Smart and Flexible Digital-to-Analog Converters will be useful
to both advanced professionals and newcomers in the field. Advanced
professionals will find new methods that are fully elaborated from
analysis at conceptual level to measurement results at test-chip level.
New comers in the field will find structured knowledge of fully
referenced state-of-the art methods with many fully explained novelties.
