Simulation of Transport in NanodevicesHardcover, 12 February 2016

Simulation of Transport in Nanodevices
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Print Length
228 pages
Language
English
Publisher
Wiley-Iste
Date Published
12 Feb 2016
ISBN-10
1848215665
ISBN-13
9781848215665

Description

Linear current-voltage pattern, has been and continues to be the basis for characterizing, evaluating performance, and designing integrated circuits, but is shown not to hold its supremacy as channel lengths are being scaled down. In a nanoscale circuit with reduced dimensionality in one or more of the three Cartesian directions, quantum effects transform the carrier statistics. In the high electric field, the collision free ballistic transform is predicted, while in low electric field the transport remains predominantly scattering-limited. In a micro/nano-circuit, even a low logic voltage of 1 V is above the critical voltage triggering nonohmic behavior that results in ballistic current saturation. A quantum emission may lower this ballistic velocity.

Product Details

Book Format:
Hardcover
Country of Origin:
US
Date Published:
12 February 2016
Dimensions:
23.39 x 15.6 x 2.24 cm
ISBN-10:
1848215665
ISBN-13:
9781848215665
Language:
English
Pages:
228
Publisher:
Wiley-Iste
Weight:
730.28 gm

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