Since the advent of planar technology the literature on semi- conductor
devices has been growing exponentially. This book of over 14000
references is intended to make the world literature available to workers
in the field (beginners as well as experienced) to assist them in
finding out what has been done by others in their fields of endeavor.
The literature on theory, preparation, properties, character- ization,
packaging, instrumentation and applications of semiconductor devices is
thoroughly covered; the only aspect of preparation not covered is di
ffusion. However, several books and comprehensive review articles on
this subject are given in Chapter A. Radiation damage due to ion
implantation is given in Chapter F. Radiation damage due to all other
types of radiations is given in Chapter J. The chapters on processing
technology, radiation damage, structural defects and analysis, modeling
and packaging are quite general and apply to most types of semiconductor
devices. Special attention is given to electrical properties and
applications of FET, Schottky and charge-coupled devices in Chapters M,
N, 0 and P.