During the last four decades remarkable developments have taken place in
instrumentation and techniques for characterizing the microstructure and
microcomposition of materials. Some of the most important of these
instruments involve the use of electron beams because of the wealth of
information that can be obtained from the interaction of electron beams
with matter. The principal instruments include the scanning electron
microscope, electron probe x-ray microanalyzer, and the analytical
transmission electron microscope. The training of students to use these
instruments and to apply the new techniques that are possible with them
is an important function, which. has been carried out by formal classes
in universities and colleges and by special summer courses such as the
ones offered for the past 19 years at Lehigh University. Laboratory
work, which should be an integral part of such courses, is often
hindered by the lack of a suitable laboratory workbook. While laboratory
workbooks for transmission electron microscopy have-been in existence
for many years, the broad range of topics that must be dealt with in
scanning electron microscopy and microanalysis has made it difficult for
instructors to devise meaningful experiments. The present workbook
provides a series of fundamental experiments to aid in "hands-on"
learning of the use of the instrumentation and the techniques. It is
written by a group of eminently qualified scientists and educators. The
importance of hands-on learning cannot be overemphasized.