Jianjun Gao

(Author)

RF and Microwave Modeling and Measurement Techniques for Field Effect TransistorsHardcover, 30 June 2010

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors
Qty
1
Turbo
Ships in 2 - 3 days
In Stock
Free Delivery
Cash on Delivery
15 Days
Free Returns
Secure Checkout
Buy More, Save More
Part of Series
Electromagnetic Waves
Part of Series
Electromagnetics and Radar
Print Length
350 pages
Language
English
Publisher
SciTech Publishing
Date Published
30 Jun 2010
ISBN-10
1891121898
ISBN-13
9781891121890

Description

This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based.

Product Details

Author:
Jianjun Gao
Book Format:
Hardcover
Country of Origin:
US
Date Published:
30 June 2010
Dimensions:
23.37 x 15.75 x 2.29 cm
Genre:
Applied/Practical
ISBN-10:
1891121898
ISBN-13:
9781891121890
Language:
English
Location:
Raleigh
Pages:
350
Weight:
589.67 gm

Related Categories


Need Help?
+971 6 731 0280
support@gzb.ae

About UsContact UsPayment MethodsFAQsShipping PolicyRefund and ReturnTerms of UsePrivacy PolicyCookie Notice

VisaMastercardCash on Delivery

© 2024 White Lion General Trading LLC. All rights reserved.