This book provides a comprehensive framework for workers in materials
science, physics, chemistry, metrology and non-destructive testing,
entering the field of photothermal and thermal wave techniques and can
be used by those making use of these methods for a wide range of
applications. The essential physics is covered from basic principles,
using thermal wave analysis to gain physical insight. Each of the
commonly used measurement systems is described and assessed, and the
major application areas: spectroscopy; non-destructive evaluation;
thermal properties measurement and semiconductor material evaluation are
each reviewed.