In the last decade, the study of nanoparticle (NP) systems has become
interesting research area due to their novel properties and
functionalities, which are different from those of the bulk materials,
and also their potential applications in many different areas. The
direct measurement of the electrical properties of metal NPs presents a
key challenge and necessitates the use of innovative experimental
techniques. There have been numerous reports of four point resistance
measurements of NPs films. However, using novel microwave techniques
such as the coaxial probe and dielectric resonator for electrical
characterisation of metallic NPs, more accurate and effective results
can be obtained compared with other traditional techniques. This book
describes the microwave properties of metallic NPs, obtained using these
techniques. It is expected to be of benefit to researchers involved in
synthesis and materials characterisation of metal NP systems. It should
also be useful to researchers in other disciplines, such as materials
scientists and electrochemists, who wish to understand the capabilities
and limitation of synthesis and characterisation techniques that they
use.