The near-field region within an order of 100 nm from the solid interface
is an exciting and crucial arena where many important multiscale
transport phenomena are physically characterized, such as flow mixing
and drag, heat and mass transfer, near-wall behavior of nanoparticles,
binding of bio-molecules, crystallization, surface deposition processes,
just naming a few. This monograph presents a number of label-free
experimental techniques developed and tested for near-field fluid flow
characterization. Namely, these include Total Internal Reflection
Microscopy (TIRM), Optical Serial Sectioning Microscopy (OSSM), Surface
Plasmon Resonance Microscopy (SPRM), Interference Reflection Contrast
Microscopy (IRCM), Thermal Near-Field Anemometry, Scanning Thermal
Microscopy (STM), and Micro-Cantilever Near-Field Thermometry.
Presentation on each of these is laid out for the working principle, how
to implement the system, and its example applications, to promote the
readers understanding and knowledge of the specific technique that can
be applied for their own research interests.