The world of microelectronics is filled with cusses measurement systems,
manufacturing many success stories. From the use of semi- control
techniques, test, diagnostics, and fail- ure analysis. It discusses
methods for modeling conductors for powerful desktop computers to their
use in maintaining optimum engine per- and reducing defects, and for
preventing de- formance in modem automobiles, they have fects in the
first place. The approach described, clearly improved our daily lives.
The broad while geared to the microelectronics world, has useability of
the technology is enabled, how- applicability to any manufacturing
process of similar complexity. The authors comprise some ever, only by
the progress made in reducing their cost and improving their
reliability. De- of the best scientific minds in the world, and fect
reduction receives a significant focus in our are practitioners of the
art. The information modem manufacturing world, and high-quality
captured here is world class. I know you will diagnostics is the key
step in that process. find the material to be an excellent reference in
of product failures enables step func- Analysis your application. tion
improvements in yield and reliability. which works to reduce cost and
open up new Dr. Paul R. Low applications and technologies. IBM Vice
President and This book describes the process ofdefect re- of Technology
Products General Manager duction in the microelectronics world.
