Allyson L Hartzell

(Author)

Mems Reliability (2011)Paperback - 2011, 27 December 2012

Mems Reliability (2011)
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Part of Series
Mems Reference Shelf
Print Length
291 pages
Language
English
Publisher
Springer
Date Published
27 Dec 2012
ISBN-10
1461427363
ISBN-13
9781461427360

Description

The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it.

MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.

Product Details

Authors:
Allyson L HartzellMark G Da SilvaHerbert R Shea
Book Edition:
2011
Book Format:
Paperback
Country of Origin:
NL
Date Published:
27 December 2012
Dimensions:
23.39 x 15.6 x 1.65 cm
ISBN-10:
1461427363
ISBN-13:
9781461427360
Language:
English
Location:
New York, NY
Pages:
291
Publisher:
Weight:
435.45 gm

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