This book defines the application of Information Technology's systematic
and automated knowledge mapping methodology to collect, analyze and
report nanotechnology research on a global basis. It offers a systematic
presentation of the state-of-the-art of nanotechnology. Coverage
includes basic analysis, content analysis, and citation network analysis
of comprehensive nanotechnology findings across technology domains,
inventors, institutions, and countries. The book explores many sources
in detail including, the nanotechnology patent and literature databases
from the US patent Office (USPTO), the European Patent Office (EPO), and
the Japanese Patent Office (JPO).