Hsinchun Chen

(Author)

Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Analysis (2009)Hardcover - 2009, 4 December 2008

Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Analysis (2009)
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Part of Series
Integrated Information Systems
Part of Series
Integrated Series in Information Systems
Print Length
330 pages
Language
English
Publisher
Springer
Date Published
4 Dec 2008
ISBN-10
038771619X
ISBN-13
9780387716190

Description

This book defines the application of Information Technology's systematic and automated knowledge mapping methodology to collect, analyze and report nanotechnology research on a global basis. It offers a systematic presentation of the state-of-the-art of nanotechnology. Coverage includes basic analysis, content analysis, and citation network analysis of comprehensive nanotechnology findings across technology domains, inventors, institutions, and countries. The book explores many sources in detail including, the nanotechnology patent and literature databases from the US patent Office (USPTO), the European Patent Office (EPO), and the Japanese Patent Office (JPO).

Product Details

Author:
Hsinchun Chen
Book Edition:
2009
Book Format:
Hardcover
Country of Origin:
US
Date Published:
4 December 2008
Dimensions:
24.38 x 15.49 x 2.03 cm
ISBN-10:
038771619X
ISBN-13:
9780387716190
Language:
English
Location:
New York, NY
Pages:
330
Publisher:
Weight:
725.75 gm

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