Lock-In Thermography: Basics and Use for Evaluating Electronic Devices and Materials (2010)Hardcover - 2010, 5 September 2010

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.