Peter Pichler

(Author)

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Softcover Reprint of the Original 1st 2004)Paperback - Softcover Reprint of the Original 1st 2004, 1 November 2012

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Softcover Reprint of the Original 1st 2004)
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Part of Series
Computational Microelectronics
Print Length
554 pages
Language
English
Publisher
Springer
Date Published
1 Nov 2012
ISBN-10
3709172047
ISBN-13
9783709172049

Description

This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.

Product Details

Author:
Peter Pichler
Book Edition:
Softcover Reprint of the Original 1st 2004
Book Format:
Paperback
Country of Origin:
NL
Date Published:
1 November 2012
Dimensions:
25.4 x 17.78 x 3.02 cm
ISBN-10:
3709172047
ISBN-13:
9783709172049
Language:
English
Location:
Vienna
Pages:
554
Publisher:
Weight:
1006.97 gm

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