Part I: Preliminaries and Previous Work.- Circuits and Testing.- Boolean
Satisfiability.- ATPG Based on Boolean Satisfiability.- Part II: New SAT
Techniques and their Application in ATPG.- Dynamic Clause Activation.-
Circuit-based Dynamic Learning.- Part III: High Quality Delay Test
Generation.- High Quality ATPG for Transition Faults.- Path Delay Fault
Model.- Summary and Outlook.