Stephan Eggersglüß

(Author)

High Quality Test Pattern Generation and Boolean Satisfiability (2012)Paperback - 2012, 20 October 2014

High Quality Test Pattern Generation and Boolean Satisfiability (2012)
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Print Length
193 pages
Language
English
Publisher
Springer
Date Published
20 Oct 2014
ISBN-10
1489988475
ISBN-13
9781489988478

Description

Part I: Preliminaries and Previous Work.- Circuits and Testing.- Boolean Satisfiability.- ATPG Based on Boolean Satisfiability.- Part II: New SAT Techniques and their Application in ATPG.- Dynamic Clause Activation.- Circuit-based Dynamic Learning.- Part III: High Quality Delay Test Generation.- High Quality ATPG for Transition Faults.- Path Delay Fault Model.- Summary and Outlook.

Product Details

Authors:
Stephan EggersglüßRolf Drechsler
Book Edition:
2012
Book Format:
Paperback
Country of Origin:
NL
Date Published:
20 October 2014
Dimensions:
23.39 x 15.6 x 1.14 cm
ISBN-10:
1489988475
ISBN-13:
9781489988478
Language:
English
Location:
New York, NY
Pages:
193
Publisher:
Weight:
303.91 gm

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