Terry L Alford

(Author)

Fundamentals of Nanoscale Film AnalysisPaperback, 29 October 2010

Fundamentals of Nanoscale Film Analysis
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Print Length
336 pages
Language
English
Publisher
Springer
Date Published
29 Oct 2010
ISBN-10
1441939806
ISBN-13
9781441939807

Description

Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. This book focuses on the fundamental physics underlying the techniques used to analyze the nature of surfaces and near-surfaces in the properties of materials. From thin films to field effect transistors, the emphasis is on reducing dimensions from the micro to the nanoscale. Coverage includes new analytical techniques, such as x-ray fluorescence (XRF) in thin film analysis. This volume updates (with a nano focus) the well regarded 1986 book, Surface and Thin Film Analysis, by Feldman and Mayer.

Product Details

Authors:
Terry L AlfordL C FeldmanJames W Mayer
Book Format:
Paperback
Country of Origin:
NL
Date Published:
29 October 2010
Dimensions:
23.39 x 15.6 x 1.85 cm
ISBN-10:
1441939806
ISBN-13:
9781441939807
Language:
English
Location:
New York, NY
Pages:
336
Publisher:
Weight:
494.42 gm

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