Terry L Alford

(Author)

Fundamentals of Nanoscale Film Analysis (2007)Hardcover - 2007, 16 February 2007

Fundamentals of Nanoscale Film Analysis (2007)
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Print Length
336 pages
Language
English
Publisher
Springer
Date Published
16 Feb 2007
ISBN-10
0387292608
ISBN-13
9780387292601

Description

From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.

Product Details

Authors:
Terry L AlfordL C FeldmanJames W Mayer
Book Edition:
2007
Book Format:
Hardcover
Country of Origin:
US
Date Published:
16 February 2007
Dimensions:
23.44 x 16.56 x 2.41 cm
ISBN-10:
0387292608
ISBN-13:
9780387292601
Language:
English
Location:
New York, NY
Pages:
336
Publisher:
Weight:
703.07 gm

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