Fundamental Aspects of Ultrathin Dielectrics on Si-Based Devices (Softcover Reprint of the Original 1st 1998)Paperback - Softcover Reprint of the Original 1st 1998, 31 March 1998

An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.