Fundamental Aspects of Ultrathin Dielectrics on Si-Based Devices (1998)Hardcover - 1998, 31 March 1998

Fundamental Aspects of Ultrathin Dielectrics on Si-Based Devices (1998)
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Part of Series
NATO Science Partnership Subseries: 3
Part of Series
NATO Science Partnership Sub-Series 3: High Technology
Part of Series
NATO Science Series. Partnership Sub-Series 3, High Technolo
Part of Series
NATO Science Partnership Sub-Series: 3:
Print Length
507 pages
Language
English
Publisher
Springer
Date Published
31 Mar 1998
ISBN-10
0792350073
ISBN-13
9780792350071

Description

An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.

Product Details

Book Edition:
1998
Book Format:
Hardcover
Country of Origin:
US
Date Published:
31 March 1998
Dimensions:
23.39 x 15.6 x 2.87 cm
ISBN-10:
0792350073
ISBN-13:
9780792350071
Language:
English
Location:
Dordrecht
Pages:
507
Publisher:
Springer
Weight:
902.65 gm

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