Intended for wire-bonding and flip-chip packaging professionals and for
scientists and engineers working in the field of mechanical
microsensors, this practical monograph introduces novel measurement
technologies that allow for in situ and real-time examination of
physical processes during the packaging process or during subsequent
reliability tests. The measurement system presented here makes possible
measurements at formerly inaccessible packaging interconnects. For the
first time it becomes possible to describe the wire-bonding process
window in terms of the physical forces at the contact zone instead of
the applied machine settings. This is significant for a deeper
understanding and future development of these packaging processes.
Applications of the sensor in the field of wire bonding and flip-chip
characterization are also illustrated. The reader will gain much insight
into the important field of interconnection technology in semiconductor
packaging.