This book is devoted to the specific problems of electromagnetic field
(EMF) measurements in the near field and to the analysis of the main
factors which impede accuracy in these measurements. It focuses on
careful and accurate design of systems to measure in the near field
based on a thorough understanding of the fundamental engineering
principles and on an analysis of the likely system errors. Beginning
with a short introduction to electromagnetic fields with an emphasis on
the near field, it then presents methods of EMF measurements in near
field conditions. It details the factors limiting measurement accuracy
including internal ones (thermal stability, frequency response, dynamic
characteristics, susceptibility) and external ones (field integration,
mutual couplings between a probe and primary and secondary EMF sources,
directional pattern deformations). It continues with a discussion on how
to gauge the parameters declared by an EMF meter manufacturer and simple
methods for testing these parameters. It also details how designers of
measuring equipment can reconsider the near field when designing and
testing, as well as how users can exploit the knowledge within the book
to ensure their tests and results contain the most accurate measurements
possible. The SciTech Publishing Series on Electromagnetic Compatibility
provides a continuously growing body of knowledge in the latest
development and best practices in electromagnetic compatibility
engineering. This series provides specialist and non-specialist
professionals and students practical knowledge that is thoroughly
grounded in relevant theory.
