Elastic and inelastic scattering in transmission electron microscopy
(TEM) are important research subjects. For a long time, I have wished to
systematically summarize various dynamic theories associated with
quantitative electron micros- copy and their applications in simulations
of electron diffraction patterns and images. This wish now becomes
reality. The aim of this book is to explore the physics in electron
diffraction and imaging and related applications for materials
characterizations. Particular emphasis is placed on diffraction and
imaging of inelastically scattered electrons, which, I believe, have not
been discussed exten- sively in existing books. This book assumes that
readers have some preknowledge of electron microscopy, electron
diffraction, and quantum mechanics. I anticipate that this book will be
a guide to approaching phenomena observed in electron microscopy from
the prospects of diffraction physics. The SI units are employed
throughout the book except for angstrom (A), which is used occasionally
for convenience. To reduce the number of symbols used, the Fourier
transform of a real-space function P'(r), for example, is denoted by the
same symbol P'(u) in reciprocal space except that r is replaced by u.
Upper and lower limits of an integral in the book are (-co, co) unless
otherwise specified. The (-co, co) integral limits are usually omitted
in a mathematical expression for simplification. I very much appreciate
opportunity of working with Drs. J. M. Cowley and J. C. H. Spence
(Arizona State University), J.
