This book describes automated debugging approaches for the bugs and the
faults which appear in different abstraction levels of a hardware
system. The authors employ a transaction-based debug approach to systems
at the transaction-level, asserting the correct relation of
transactions. The automated debug approach for design bugs finds the
potential fault candidates at RTL and gate-level of a circuit. Debug
techniques for logic bugs and synchronization bugs are demonstrated,
enabling readers to localize the most difficult bugs. Debug automation
for electrical faults (delay faults) finds the potentially failing
speedpaths in a circuit at gate-level. The various debug approaches
described achieve high diagnosis accuracy and reduce the debugging time,
shortening the IC development cycle and increasing the productivity of
designers.