Andrei Pavlov
(Author)CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test (2008)Hardcover - 2008, 21 June 2008
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Part of Series
Frontiers in Electronic Testing
Print Length
194 pages
Language
English
Publisher
Springer
Date Published
21 Jun 2008
ISBN-10
1402083629
ISBN-13
9781402083624
Product Details
Authors:
Book Edition:
2008
Book Format:
Hardcover
Country of Origin:
NL
Date Published:
21 June 2008
Dimensions:
23.39 x
15.6 x
1.27 cm
ISBN-10:
1402083629
ISBN-13:
9781402083624
Language:
English
Location:
Dordrecht
Pages:
194
Publisher:
Weight:
476.27 gm