The subject of this book is CMOS RF circuit design for reliability. The
device reliability and process variation issues on RF transmitter and
receiver circuits will be particular interest to the readers in the
field of semiconductor devices and circuits. This proposed book is
unique to explore typical reliability issues in the device and
technology level and then to examine their impact on RF wireless
transceiver circuit performance. Analytical equations, experimental
data, device and circuit simulation results will be given for clear
explanation. The main benefit the reader derive from this book will be
clear understanding on how device reliability issues affects the RF
circuit performance subjected to operation aging and process variations.