Jiann-Shiun Yuan

(Author)

CMOS RF Circuit Design for Reliability and Variability (2016)Paperback - 2016, 21 April 2016

CMOS RF Circuit Design for Reliability and Variability (2016)
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Part of Series
Springerbriefs in Applied Sciences and Technology
Part of Series
Springerbriefs in Reliability
Print Length
106 pages
Language
English
Publisher
Springer
Date Published
21 Apr 2016
ISBN-10
9811008825
ISBN-13
9789811008825

Description

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

Product Details

Author:
Jiann-Shiun Yuan
Book Edition:
2016
Book Format:
Paperback
Country of Origin:
NL
Date Published:
21 April 2016
Dimensions:
23.39 x 15.6 x 0.61 cm
ISBN-10:
9811008825
ISBN-13:
9789811008825
Language:
English
Location:
Singapore
Pages:
106
Publisher:
Weight:
172.36 gm

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