Microcharacterization of materials is a rapidly advancing field. Among
the many electron and ion probe techniques, the cathodoluminescence mode
of an electron probe instrument has reached a certain maturity, which is
reflected by an increas- ing number of publications in this field. The
rapid rate of progress in applications of cathodoluminescence techniques
in characterizing inorganic solids has been especially noticeable in
recent years. The main purpose of the book is to outline the
applications of cath- odoluminescence techniques in the assessment of
optical and electronic proper- ties of inorganic solids, such as
semiconductors, phosphors, ceramics, and min- erals. The assessment
provides, for example, information on impurity levels derived from
cathodoluminescence spectroscopy, analysis of dopant concentra- tions at
a level that, in some cases, is several orders of magnitude lower than
that attainable by x-ray microanalysis, the mapping of defects, and the
determination of carrier lifetimes and the charge carrier capture cross
sections of impurities. In order to make the book self-contained, some
basic concepts of solid-state phys- ics, as well as various
cathodoluminescence techniques and the processes leading to luminescence
phenomena in inorganic solids, are also described. We hope that this
book will be useful to both scientists and graduate students interested
in microcharacterization of inorganic solids. This book, however, was
not intended as a definitive account of cathodoluminescence analysis of
in- organic solids. In considering the results presented here, readers
should re- member that many materials have properties that vary widely
as a function of preparation conditions.
