A discussion of recently developed experimental methods for noise
research in nanoscale electronic devices, conducted by specialists in
transport and stochastic phenomena in nanoscale physics. The approach
described is to create methods for experimental observations of noise
sources, their localization and their frequency spectrum,
voltage-current and thermal dependences. Our current knowledge of
measurement methods for mesoscopic devices is summarized to identify
directions for future research, related to downscaling effects.
The directions for future research into fluctuation phenomena in quantum
dot and quantum wire devices are specified. Nanoscale electronic devices
will be the basic components for electronics of the 21st century. From
this point of view the signal-to-noise ratio is a very important
parameter for the device application. Since the noise is also a quality
and reliability indicator, experimental methods will have a wide
application in the future.