This book offers a comprehensive reference guide for graduate students
and professionals in both academia and industry, covering the
fundamentals, architecture, processing details, and applications of 3D
microelectronic packaging. It provides readers an in-depth understanding
of the latest research and development findings regarding this key
industry trend, including TSV, die processing, micro-bumps for LMI and
MMI, direct bonding and advanced materials, as well as quality,
reliability, fault isolation, and failure analysis for 3D
microelectronic packages. Images, tables, and didactic schematics are
used to illustrate and elaborate on the concepts discussed. Readers will
gain a general grasp of 3D packaging, quality and reliability concerns,
and common causes of failure, and will be introduced to developing areas
and remaining gaps in 3D packaging that can help inspire future research
and development.